直线光栅尺
增量式
LIK系列
LIKselect
The new LIK series stands for versatile configuration options, flexible integration, and miniaturization of applications.
The brand-new, three-field scanning module with integrated sensor electronics offers multiple improvements:
- Highly compact and configurable scanning unit
- 20 μm grating period and measuring steps down to 78.125 nm
- New three-field scanning technology with improved signal quality
- No phase and offset errors
- Interfaces: 1 VPP , TTL, or RS-422
- Very low power consumption and heat accumulation
- Interpolated TTL signals from scanning module without additional electronics
- Electronic adjustment capability after mounting to reduce static mounting errors, and an improved ADJUSTMENT TOOL connection
- Signal adjustment possible with PWT 101 from HEIDENHAIN

Make your IDEAS come true
High number of variants due to modular design and individually adaptable components
Save SPACE
Considerable space savings for integration thanks to a highly compact and low-profile design
Precise POSITIONING
High signal quality and stability thanks to a new sensor design and three separate scanning fields
LIKgo
LIKgo是NUMERIK JENA推出的全新、特别设计的直线光栅尺,用以更好地满足客户的要求。全新兩场读数模块提升多项性能,简化用户的安装操作。
全新入门级的LIKgo敞开式光学光栅尺性能优异,为即将推出的多款产品打造基础。全新设计还创新地融合NUMERIK JENA产品的突出优点。全新LIK系列产品设计的目标是:易用性、广泛的应用范围和高质量标准。
- 小巧和轻型读数头
- 20 µm栅距和测量步距达78.125 nm
- 全新2场扫描技术,提供极高的信号质量
- 无相位和偏移误差
- 更小细分误差
- 极小的功耗和发热
- 无需其它电子电路,在读数头中细分TTL信号
- 安装后可进行电子调试,减小静态安装误差
- 改进“调试工具”的连接